Four Dimensions

Semiconductor Probing Systems

• Four point probes with extended measurement range for compound semiconductors
• Mercury four point probe for ultra shallow junction probing
• CVmap systems perform capacitance-voltage (CV) and current-voltage (IV) measurements directly on unmetalized wafers using a uniquely designed Mercury probe
• For a wide range of materials, including semi-conductors, oxides, dielectrics, SOI (silicon on insulator) and films on conducting or insulating substrates